ISO 24173:2024
International Standard
Current Edition
·
Approved on
09 February 2024
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2024 Files
English
40 Pages
Current Edition
79.15 OMR
ISO 24173:2024 Scope
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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